smartctl 5.42 2011-10-20 r3458 [x86_64-linux-3.2.12-gentoo] (local build) Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: SAMSUNG MMCQE28G8MUP-0VA Serial Number: SE840B6037 Firmware Version: VAM08L1Q User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1 Local Time is: Sun Apr 1 21:12:00 2012 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 360) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 6) minutes. Extended self-test routine recommended polling time: ( 36) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 9 Power_On_Hours 0x0032 096 096 000 Old_age Always - 16293 12 Power_Cycle_Count 0x0032 095 095 000 Old_age Always - 4311 175 Program_Fail_Count_Chip 0x0032 100 100 011 Old_age Always - 0 176 Erase_Fail_Count_Chip 0x0032 100 100 011 Old_age Always - 0 177 Wear_Leveling_Count 0x0013 099 099 023 Pre-fail Always - 35 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 090 090 011 Pre-fail Always - 12 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 098 098 010 Pre-fail Always - 61 180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 098 098 010 Pre-fail Always - 3843 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0 187 Reported_Uncorrect 0x0033 100 100 000 Pre-fail Always - 0 195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 253 253 000 Old_age Always - 0 233 Media_Wearout_Indicator 0x003a 001 001 000 Old_age Always - 1541731 234 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0 235 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0 236 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 107 237 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 339 238 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 7871 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.